CHAPTER BOOKS
- Nonlinear Filters for Image Processing
- Local Approximation Techniques in Signal and Image Processing
- Demystifying Electromagnetic Equations: A Complete Explanation of EM Unit Systems and Equation Transformations
- Digital Shearography: Theory and Application of Digital Speckle Pattern Shearing Interferometry
CHAPTER PROCEEDINGS
- Two- and Three-Dimensional Methods for Inspection and Metrology IV (Proceedings Volume - 6382)
- SAR Image Analysis, Modeling, and Techniques VIII (Proceedings Volume - 6363)
- Advanced LEDs for Solid State Lighting (Proceedings Volume - 6355)
- Nonimaging Optics and Efficient Illumination Systems III (Proceedings Volume - 6338)
- Image Reconstruction from Incomplete Data IV (Proceedings Volume - 6316)
- Mathematics of Data/Image Pattern Recognition, Compression, and Encryption with Applications IX (Proceedings Volume - 6315)
- Advanced Wavefront Control: Methods, Devices, and Applications IV (Proceedings Volume - 6306)
- Interferometry XIII: Applications (Proceedings Volume - 6293)
- Interferometry XIII: Techniques and Analysis (Proceedings Volume - 6292)
- The Nature of Light: Light in Nature (Proceedings Volume - 6285)
- Algorithms for Synthetic Aperture Radar Imagery XIII (Proceedings Volume - 6237)
- Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII (Proceedings Volume - 6090)
- Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues IV (Proceedings Volume - 6088)
- Multimodal Biomedical Imaging (Proceedings Volume - 6081)
- Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X (Proceedings Volume - 6079)
- Image Processing: Algorithms and Systems, Neural Networks, and Machine Learning (Proceedings Volume - 6064)
- MIPPR 2005: Image Analysis Techniques (Proceedings Volume - 6044)
- Optical Measurement Systems for Industrial Inspection III (Proceedings Volume - 5144)
- Interferometry XI: Applications (Proceedings Volume - 4778)
- Machine Vision Applications in Industrial Inspection X (Proceedings Volume - 4664)